Determination of the inelastic mean free path of electrons in vitrified ice layers for on-line thickness measurements by zero-loss imaging (Q41629614)
Jump to navigation
Jump to search
scientific article published on January 1999
Language | Label | Description | Also known as |
---|---|---|---|
English | Determination of the inelastic mean free path of electrons in vitrified ice layers for on-line thickness measurements by zero-loss imaging |
scientific article published on January 1999 |
Statements
1 reference
Determination of the inelastic mean free path of electrons in vitrified ice layers for on-line thickness measurements by zero-loss imaging (English)
1 reference
B Feja
1 reference
U Aebi
1 reference
1 January 1999
1 reference
1 reference
193
1 reference
1
1 reference
15-19
1 reference
1 reference
1 reference
Identifiers
1 reference
1 reference