Determination of the inelastic mean free path of electrons in vitrified ice layers for on-line thickness measurements by zero-loss imaging (Q41629614)
scientific article published on January 1999
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| English | Determination of the inelastic mean free path of electrons in vitrified ice layers for on-line thickness measurements by zero-loss imaging |
scientific article published on January 1999 |
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Determination of the inelastic mean free path of electrons in vitrified ice layers for on-line thickness measurements by zero-loss imaging (English)
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B Feja
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U Aebi
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1 January 1999
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193
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15-19
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