EELS log-ratio technique for specimen-thickness measurement in the TEM. (Q36442526)
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| English | EELS log-ratio technique for specimen-thickness measurement in the TEM. |
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EELS log-ratio technique for specimen-thickness measurement in the TEM. (English)
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Malis T
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Cheng SC
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Egerton RF
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1 February 1988
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8
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2
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193-200
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