Focused ion beam-nanomachined probes for improved electric force microscopy (Q81801757)
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scientific article published on 01 October 2005
Language | Label | Description | Also known as |
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English | Focused ion beam-nanomachined probes for improved electric force microscopy |
scientific article published on 01 October 2005 |
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Focused ion beam-nanomachined probes for improved electric force microscopy (English)
Claudia Menozzi
Gian Carlo Gazzadi
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