Oxide thickness dependence of energy shifts in the Si 2p levels for the SiO2/Si structure, and its elimination by a palladium overlayer (Q77027317)
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scholarly article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Oxide thickness dependence of energy shifts in the Si 2p levels for the SiO2/Si structure, and its elimination by a palladium overlayer |
scholarly article |
Statements
Oxide thickness dependence of energy shifts in the Si 2p levels for the SiO2/Si structure, and its elimination by a palladium overlayer (English)
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1998
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73
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933-935
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1 reference