Absolute interfacial distance measurements by dual-wavelength reflection interference contrast microscopy (Q76398861)
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scientific article published on 12 February 2004
Language | Label | Description | Also known as |
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English | Absolute interfacial distance measurements by dual-wavelength reflection interference contrast microscopy |
scientific article published on 12 February 2004 |
Statements
Absolute interfacial distance measurements by dual-wavelength reflection interference contrast microscopy (English)
Erich Sackmann
Jörg Schilling
Stefanie Goennenwein
Andreas R Bausch
12 February 2004