Investigation of the structure of damage layers in TEM samples prepared using a focused ion beam (Q62594528)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Investigation of the structure of damage layers in TEM samples prepared using a focused ion beam |
No description defined |
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Investigation of the structure of damage layers in TEM samples prepared using a focused ion beam (English)
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2001
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20
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13
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1181-1183
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