Combined use of atomic force microscopy, X-ray photoelectron spectroscopy, and secondary ion mass spectrometry for cell surface analysis (Q61503138)
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scientific article published on 01 February 2008
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Combined use of atomic force microscopy, X-ray photoelectron spectroscopy, and secondary ion mass spectrometry for cell surface analysis |
scientific article published on 01 February 2008 |
Statements
Combined use of atomic force microscopy, X-ray photoelectron spectroscopy, and secondary ion mass spectrometry for cell surface analysis (English)
Arnaud Delcorte
1 February 2008