Material-specific mapping of metal/semiconductor/dielectric nanosystems at 10 nm resolution by backscattering near-field optical microscopy (Q57656482)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Material-specific mapping of metal/semiconductor/dielectric nanosystems at 10 nm resolution by backscattering near-field optical microscopy |
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Material-specific mapping of metal/semiconductor/dielectric nanosystems at 10 nm resolution by backscattering near-field optical microscopy (English)
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7 January 2002
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80
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1
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25-27
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