Ellipsometric characterization of doped Ge<sub>0.95</sub>Sn<sub>0.05</sub> films in the infrared range for plasmonic applications. (Q51164180)
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scientific article published in September 2016
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Ellipsometric characterization of doped Ge<sub>0.95</sub>Sn<sub>0.05</sub> films in the infrared range for plasmonic applications. |
scientific article published in September 2016 |
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Ellipsometric characterization of doped Ge<sub>0.95</sub>Sn<sub>0.05</sub> films in the infrared range for plasmonic applications. (English)
1 reference
I A Fischer
F Hornung
M Dressel
M Oehme
1 September 2016
1 reference