Analysis of the causes of variance in resistance measurements on metal-molecule-metal junctions formed by conducting-probe atomic force microscopy. (Q51159932)
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scientific article published in September 2005
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Analysis of the causes of variance in resistance measurements on metal-molecule-metal junctions formed by conducting-probe atomic force microscopy. |
scientific article published in September 2005 |
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Analysis of the causes of variance in resistance measurements on metal-molecule-metal junctions formed by conducting-probe atomic force microscopy. (English)
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C Daniel Frisbie
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Vincent B Engelkes
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Jeremy M Beebe
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1 September 2005
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109
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35
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16801-16810
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