Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA. (Q44763380)
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scientific article published in February 2004
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA. |
scientific article published in February 2004 |
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Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA. (English)
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Collin J May
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Heather E Canavan
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David G Castner
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1 February 2004
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76
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4
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1114-1122
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Identifiers
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