Limits of detection for time of flight secondary ion mass spectrometry (ToF-SIMS) and X-ray photoelectron spectroscopy (XPS): detection of low amounts of adsorbed protein (Q44087757)
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scientific article published in January 2002
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Limits of detection for time of flight secondary ion mass spectrometry (ToF-SIMS) and X-ray photoelectron spectroscopy (XPS): detection of low amounts of adsorbed protein |
scientific article published in January 2002 |
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Limits of detection for time of flight secondary ion mass spectrometry (ToF-SIMS) and X-ray photoelectron spectroscopy (XPS): detection of low amounts of adsorbed protein (English)
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Matthew S Wagner
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Mingchao Shen
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Thomas A Horbett
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David G Castner
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1 January 2002
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