Parallel Accumulation-Serial Fragmentation (PASEF): Multiplying Sequencing Speed and Sensitivity by Synchronized Scans in a Trapped Ion Mobility Device. (Q40354913)
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scientific article published on 5 November 2015
Language | Label | Description | Also known as |
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English | Parallel Accumulation-Serial Fragmentation (PASEF): Multiplying Sequencing Speed and Sensitivity by Synchronized Scans in a Trapped Ion Mobility Device. |
scientific article published on 5 November 2015 |
Statements
Parallel Accumulation-Serial Fragmentation (PASEF): Multiplying Sequencing Speed and Sensitivity by Synchronized Scans in a Trapped Ion Mobility Device (English)
Scarlet Beck
Niklas Grassl
Markus Lubeck
Melvin A Park
Oliver Raether
Matthias Mann
13 November 2015