Strain measurement in semiconductor heterostructures by scanning transmission electron microscopy (Q39544379)
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scientific article published on 2 October 2012
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Strain measurement in semiconductor heterostructures by scanning transmission electron microscopy |
scientific article published on 2 October 2012 |
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Strain measurement in semiconductor heterostructures by scanning transmission electron microscopy (English)
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Marco Schowalter
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Knut Müller
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Josef Zweck
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Rafael Fritz
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Kerstin Volz
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2 October 2012
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