On the characterization of ultra-precise X-ray optical components: advances and challenges in ex situ metrology (Q35236175)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | On the characterization of ultra-precise X-ray optical components: advances and challenges in ex situ metrology |
scientific article |
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On the characterization of ultra-precise X-ray optical components: advances and challenges in ex situ metrology (English)
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J Buchheim
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F Siewert
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T Zeschke
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M Störmer
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G Falkenberg
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R Sankari
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27 August 2014
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