Microinterferometry: Three-Dimensional Reconstruction of Surface Microtopography for Thin-Film and Wetting Studies by Reflection Interference Contrast Microscopy (RICM). (Q34755771)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Microinterferometry: Three-Dimensional Reconstruction of Surface Microtopography for Thin-Film and Wetting Studies by Reflection Interference Contrast Microscopy (RICM). |
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Microinterferometry: Three-Dimensional Reconstruction of Surface Microtopography for Thin-Film and Wetting Studies by Reflection Interference Contrast Microscopy (RICM). (English)
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Wiegand G
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Neumaier KR
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Sackmann E
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1 October 1998
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