Two-photon excitation selective plane illumination microscopy (2PE-SPIM) of highly scattering samples: characterization and application (Q34332426)
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English | Two-photon excitation selective plane illumination microscopy (2PE-SPIM) of highly scattering samples: characterization and application |
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Two-photon excitation selective plane illumination microscopy (2PE-SPIM) of highly scattering samples: characterization and application (English)
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Emiliano Ronzitti
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