Image segmentation for automatic particle identification in electron micrographs based on hidden Markov random field models and expectation maximization (Q34205678)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Image segmentation for automatic particle identification in electron micrographs based on hidden Markov random field models and expectation maximization |
scientific article |
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Image segmentation for automatic particle identification in electron micrographs based on hidden Markov random field models and expectation maximization (English)
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Vivek Singh
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Dan C Marinescu
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Timothy S Baker
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1 January 2004
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145
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1-2
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123-141
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