Localized grounding, excavation, and dissection using in-situ probe techniques for focused ion beam and scanning electron microscopy: experiments with rock varnish (Q34158192)
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English | Localized grounding, excavation, and dissection using in-situ probe techniques for focused ion beam and scanning electron microscopy: experiments with rock varnish |
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Localized grounding, excavation, and dissection using in-situ probe techniques for focused ion beam and scanning electron microscopy: experiments with rock varnish (English)
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David Krinsley
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Kurt Langworthy
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Jeffrey Ditto
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13 February 2012
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34
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279-283
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