Characterization of uniform ultrathin layer for z-response measurements in three-dimensional section fluorescence microscopy. (Q33272638)
Jump to navigation
Jump to search
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Characterization of uniform ultrathin layer for z-response measurements in three-dimensional section fluorescence microscopy. |
scientific article |
Statements
Characterization of uniform ultrathin layer for z-response measurements in three-dimensional section fluorescence microscopy (English)
Krol S
1 January 2007
1 reference
1 reference
1 reference
1 reference
1 reference
1 reference
1 reference