Conventional and back-side focused ion beam milling for off-axis electron holography of electrostatic potentials in transistors (Q33213028)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Conventional and back-side focused ion beam milling for off-axis electron holography of electrostatic potentials in transistors |
scientific article |
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Conventional and back-side focused ion beam milling for off-axis electron holography of electrostatic potentials in transistors (English)
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Simon B Newcomb
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Martha R McCartney
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12 January 2005
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103
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67-81
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