Method for Cross-sectional Thin Specimen Preparation from a Specific Site Using a Combination of a Focused Ion Beam System and Intermediate Voltage Electron Microscope and Its Application to the Characterization of a Precipitate in a Steel (Q30888568)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Method for Cross-sectional Thin Specimen Preparation from a Specific Site Using a Combination of a Focused Ion Beam System and Intermediate Voltage Electron Microscope and Its Application to the Characterization of a Precipitate in a Steel |
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Method for Cross-sectional Thin Specimen Preparation from a Specific Site Using a Combination of a Focused Ion Beam System and Intermediate Voltage Electron Microscope and Its Application to the Characterization of a Precipitate in a Steel (English)
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Toshie Yaguchi
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Hiroaki Matsumoto
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Takeo Kamino
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Tohru Ishitani
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Ryoichi Urao
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1 May 2001
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287-291
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Identifiers
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