Imaging in-plane and normal stresses near an interface crack using traction force microscopy (Q30496362)
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English | Imaging in-plane and normal stresses near an interface crack using traction force microscopy |
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Imaging in-plane and normal stresses near an interface crack using traction force microscopy (English)
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Ye Xu
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Wilfried C Engl
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Elizabeth R Jerison
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Kevin J Wallenstein
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Callen Hyland
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Larry A Wilen
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Eric R Dufresne
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9 August 2010
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107
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14964-14967
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