Mechanical Vertical Manipulation of Selected Single Atoms by Soft Nanoindentation Using Near Contact Atomic Force Microscopy (Q27450914)

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scientific article

Mechanical vertical manipulation of selected single atoms by soft nanoindentation using near contact atomic force microscopy

Language	Label	Description	Also known as
English	Mechanical Vertical Manipulation of Selected Single Atoms by Soft Nanoindentation Using Near Contact Atomic Force Microscopy	scientific article	Mechanical vertical manipulation of selected single atoms by soft nanoindentation using near contact atomic force microscopy

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scholarly article

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Mechanical Vertical Manipulation of Selected Single Atoms by Soft Nanoindentation Using Near Contact Atomic Force Microscopy (English)

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nanoindentation

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based on heuristic

inferred from title

author name string

Noriaki Oyabu

1

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Óscar Custance

2

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Insook Yi

3

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Yasuhiro Sugawara

4

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Seizo Morita

5

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language of work or name

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publication date

2 May 2003

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May 2003

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Physical Review Letters

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90

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176102

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17

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Atomic resolution of the silicon (111)-(7x7) surface by atomic force microscopy.

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVLETT.90.176102

21 January 2018

Imaging the atomic arrangements on the high-temperature reconstructed alpha-Al2O3(0001) surface.

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVLETT.90.176102

21 January 2018

Quantitative measurement of short-range chemical bonding forces

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https://api.crossref.org/works/10.1103%2FPHYSREVLETT.90.176102

21 January 2018

Inducing and viewing the rotational motion of a single molecule

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https://api.crossref.org/works/10.1103%2FPHYSREVLETT.90.176102

21 January 2018

Single-bond formation and characterization with a scanning tunneling microscope

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https://api.crossref.org/works/10.1103%2FPHYSREVLETT.90.176102

21 January 2018

Molecule cascades

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https://api.crossref.org/works/10.1103%2FPHYSREVLETT.90.176102

21 January 2018

Field-Induced Nanometer- to Atomic-Scale Manipulation of Silicon Surfaces with the STM.

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https://api.crossref.org/works/10.1103%2FPHYSREVLETT.90.176102

21 January 2018

Formation of nanometer-scale grooves in silicon with a scanning tunneling microscope

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https://api.crossref.org/works/10.1103%2FPHYSREVLETT.90.176102

21 January 2018

Forces and frequency shifts in atomic-resolution dynamic-force microscopy

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https://api.crossref.org/works/10.1103%2FPHYSREVLETT.90.176102

21 January 2018

Dynamic force microscopy of copper surfaces: Atomic resolution and distance dependence of tip-sample interaction and tunneling current

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVLETT.90.176102

21 January 2018

Positioning single atoms with a scanning tunnelling microscope

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVLETT.90.176102

21 January 2018

An atomic switch realized with the scanning tunnelling microscope

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https://api.crossref.org/works/10.1103%2FPHYSREVLETT.90.176102

21 January 2018

Identifiers

10.1103/PHYSREVLETT.90.176102

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