Simultaneous current, force and dissipation measurements on the Si(111) 7×7 surface with an optimized qPlus AFM/STM technique (Q24598728)

21 June 2017

Simultaneous current, force and dissipation measurements on the Si(111) 7×7 surface with an optimized qPlus AFM/STM technique (English)

1 reference

21 June 2017

Pavel Jelínek

6

1 reference

ORCID Public Data File 2021

author name string

Zsolt Majzik

1

1 reference

21 June 2017

Martin Setvín

2

1 reference

21 June 2017

Andreas Bettac

3

1 reference

21 June 2017

Albrecht Feltz

4

1 reference

21 June 2017

Vladimír Cháb

5

1 reference

21 June 2017

language of work or name

English

0 references

publication date

15 March 2012

1 reference

Beilstein Journal of Nanotechnology

21 June 2017

1 reference

21 June 2017

3

1 reference

21 June 2017

249-259

1 reference

21 June 2017

Atomic force microscope

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=3323914

Phantom Force Induced by Tunneling Current: A Characterization on Si(111)

24 March 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=3323914

The Chemical Structure of a Molecule Resolved by Atomic Force Microscopy

24 March 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=3323914

Energy levels of few-electron quantum dots imaged and characterized by atomic force microscopy

24 March 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=3323914

Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy

27 September 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=3323914

The force needed to move an atom on a surface

27 September 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=3323914

Atomic resolution of the silicon (111)-(7x7) surface by atomic force microscopy.

27 September 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=3323914

Revealing the hidden atom in graphite by low-temperature atomic force microscopy

27 September 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=3323914

Quantitative measurement of short-range chemical bonding forces

27 September 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=3323914

Single atomic contact adhesion and dissipation in dynamic force microscopy.

27 September 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=3323914

Relation between the chemical force and the tunnelling current in atomic point contacts: a simple model

28 November 2018

1 reference

12 December 2020

Quantitative Atomic Force Microscopy with Carbon Monoxide Terminated Tips

1 reference

12 December 2020

General theory of microscopic dynamical response in surface probe microscopy: from imaging to dissipation

1 reference

12 December 2020

Experimental observation of forces acting during scanning tunneling microscopy

1 reference

12 December 2020

Suppression of electronic friction on Nb films in the superconducting state

1 reference

12 December 2020

Identification of nanoscale dissipation processes by dynamic atomic force microscopy

1 reference

12 December 2020

Tip-Induced Reduction of the Resonant Tunneling Current on Semiconductor Surfaces

1 reference

12 December 2020

Interplay of Conductance, Force, and Structural Change in Metallic Point Contacts

1 reference

12 December 2020

Atomically resolved imaging by low-temperature frequency-modulation atomic force microscopy using a quartz length-extension resonator

1 reference

12 December 2020

Metallic adhesion in atomic-size junctions

1 reference

12 December 2020

Atomic force microscopy at ambient and liquid conditions with stiff sensors and small amplitudes

1 reference

12 December 2020

Ubiquitous Mechanisms of Energy Dissipation in Noncontact Atomic Force Microscopy

1 reference

12 December 2020

Noncontact Atomic Force Microscopy

1 reference

https://api.crossref.org/works/10.3762%2FBJNANO.3.28

7 January 2021

Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy

1 reference

https://api.crossref.org/works/10.3762%2FBJNANO.3.28

7 January 2021

Erratum: “High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork” [Appl. Phys. Lett. 73, 3956 (1998)]

1 reference

https://api.crossref.org/works/10.3762%2FBJNANO.3.28

7 January 2021

Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork

1 reference

https://api.crossref.org/works/10.3762%2FBJNANO.3.28

7 January 2021

Atomic resolution on MgO(001) by atomic force microscopy using a double quartz tuning fork sensor at low-temperature and ultrahigh vacuum

1 reference

https://api.crossref.org/works/10.3762%2FBJNANO.3.28

7 January 2021

Atomic resolution on a metal single crystal with dynamic force microscopy

1 reference

https://api.crossref.org/works/10.3762%2FBJNANO.3.28

7 January 2021

Stability considerations and implementation of cantilevers allowing dynamic force microscopy with optimal resolution: the qPlus sensor

1 reference

https://api.crossref.org/works/10.3762%2FBJNANO.3.28

7 January 2021

Surface-tip interactions in noncontact atomic-force microscopy on reactive surfaces: Si(111)

1 reference

https://api.crossref.org/works/10.3762%2FBJNANO.3.28

7 January 2021

Dynamic force microscopy of copper surfaces: Atomic resolution and distance dependence of tip-sample interaction and tunneling current

1 reference

https://api.crossref.org/works/10.3762%2FBJNANO.3.28

7 January 2021

From tunneling to point contact: Correlation between forces and current

1 reference

https://api.crossref.org/works/10.3762%2FBJNANO.3.28

7 January 2021

Real topography, atomic relaxations, and short-range chemical interactions in atomic force microscopy: The case of theα−Sn∕Si(111)−(3×3)R30°surface

1 reference

https://api.crossref.org/works/10.3762%2FBJNANO.3.28

7 January 2021

Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators

1 reference

https://api.crossref.org/works/10.3762%2FBJNANO.3.28

7 January 2021

Surface Studies by Scanning Tunneling Microscopy

1 reference

https://api.crossref.org/works/10.3762%2FBJNANO.3.28

7 January 2021

Advances in atomic force microscopy

1 reference

https://api.crossref.org/works/10.3762%2FBJNANO.3.28

7 January 2021

Identifiers

DOI

10.3762/BJNANO.3.28

1 reference

21 June 2017

0 references

1 reference