single-event upset (Q1476733)
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change of state caused by one single ionizing particle (ion, electron, photon...) striking a sensitive node in a micro-electronic device, such as in a microprocessor, semiconductor memory, or power transistor
- single event upset
- SEU
- single-event error
- SEE
- SEUs
- SEEs
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | single-event upset |
change of state caused by one single ionizing particle (ion, electron, photon...) striking a sensitive node in a micro-electronic device, such as in a microprocessor, semiconductor memory, or power transistor |
|
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Wikipedia(8 entries)
- dewiki Single Event Upset
- enwiki Single-event upset
- eswiki Single event upset
- frwiki Perturbation par une particule isolée
- simplewiki Single event upset
- trwiki Single event upset
- ukwiki Порушення в результаті одиничної події
- zhwiki 单粒子翻转