Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron Diffraction. (Q41818650)

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scientific article published on 28 June 2016
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Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron Diffraction.
scientific article published on 28 June 2016

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    Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron Diffraction. (English)
    1 reference
    Daniel Carvalho
    1 reference
    Knut Müller-Caspary
    1 reference
    Marco Schowalter
    1 reference
    Tim Grieb
    1 reference
    Thorsten Mehrtens
    1 reference
    Teresa Ben
    1 reference
    Rafael García
    1 reference
    Andrés Redondo-Cubero
    1 reference
    Katharina Lorenz
    1 reference
    Bruno Daudin
    1 reference
    Francisco M Morales
    1 reference
    28 June 2016
    1 reference
    28459
    1 reference

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